عباس هادي عباس النعماني

In this research reportspreparation, a novel of pure zinc oxide nanoplates using simple and low-cost Hydrothermal method. X ray Diffraction detection of ZnO wurtzite phase formation, fesem showed the formation of randomly oriented zinc oxide nanosheets, and haveaverage size of particles (62.82)nm and their crystal size ranges in the range of (62.82- 26.80) nm. The energy gap value of ZnO is3.4 eV and the wavelengthvalueis247nm

The rice husk (RH) is a wide agricultural resource by-product of rice milling process in Iraq. In this work, RH is used as filler to modified thermal conductivity and dielectric constant of RTV silicone. RH-RTV silicone composites are prepared with different RH filler particle sizes, they are equal to 6.5mm (raw RH), 1.18mm, 250 μm, 125 μm, 75 μm, and 50μm. The levels of RH filler loading (1, 3, 5, 7, 10, 15 and 20) (wt %). The thermal conductivity and dielectric constant of all RH-RTV silicone composites are studied. The effect of varying frequency (from 500 Hz to 1 MHz) on dielectric constant all composites is studied. The thermal conductivity of RH-RTV silicone composites decrease with RH filler concentration increases and particle size decreases, thermal conductivity has minimum value at 20%wt. The particle size effect on thermal conductivity of composite is very observably at 50μm particle. The dielectric constant of RH-RTV silicone composites is increased when RH filler concentration increases and particle size decreases, thy have maximum value at 20%wt and 50μm RH particle. The varying of frequency is low effect on 50μm RH-RTV silicone composites.

CuZnS and CuZnS/Au NPs layer with different Cu/Zn content thin films have been deposited on heated glass substrate by spray pyrolysis technique at 330 °C and annealed at 450 °C for 1 hour. X-ray diffraction (XRD) results reveals that the structures of all prepared thin films are polycrystalline in nature, with preferential growth orientation along (111) plane corresponding to the cubic ZnS (sphalerite). Two low crystallinity of crystallographic phases corresponding to hexagonal CuS and monoclinic Cu2S were appeared with Cu/Zn different content. Strong diffraction peak of Au NPs appeared in CuZnS/Au NPs layer structure corresponding to the cubic Au gold phase oriented along (111) plane. Structure parameters such as crystallite size and number of crystalline, dislocation density and micro strain have been determined. Scanning Electron Microscopy (SEM) and Atomic force microscope (AFM) images of CZS, and CZS/Au NPs thin films shows smooth, uniform morphology and plated regularly with no detectable micro-cracks. The roughness and r.m.s. roughness was increased with increase of Cu/Zn content from 1.95 nm to 4.36 nm respectively, while it decreased with the exists of Au NPs layer from 20.9nm to 3.99 nm. The energy dispersion x-ray spectroscopy spectra demonstrate the stoichiometry of the deposited films. The optical properties results exhibits red shifted in the fundamental absorption edge towards low energies of CZS (Cu/Zn content) and CZS/Au Nps layer thin films. The optical energy gap has been decreased from (2.56 to 2.34 eV, and 2.62 to 2.32 eV) with respect to Cu/Zn content and Au Nps layer, respectively. 1