انور قاسم الكعبي ( مدرس مساعد )
كلية العلوم - البيئة والتلوث
[email protected]
Detecting Topography of WO3 Semiconductor by Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM)
بحث النوع:
علوم التخصص العام:
Anwar QA اسم الناشر:
اسماء المساعدين:
www.Nanoscience and Nanotechnology: An Indian Journal الجهة الناشرة:
.Nanoscience and Nanotechnology: An Indian Journal  
2018 سنة النشر:


The morphology of WO3 is studied by AFM microscopy in order to specify the roughness which usually controls the movement of a free electron between the different layers which is fabricated the sensor. Additionally, STM microscopy gives the electrical characteristics of the sample by (STS) in a nanoscopic scale. As well as the electronic cloud which is located in the middle distance between atoms and resulted by insertion of their electrons.